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Titre
In situ electrical resistivity measurements of vanadium thin films performed in vacuum during different annealing cycles
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BSO - Titre
In situ electrical resistivity measurements of vanadium thin films performed in vacuum during different annealing cycles
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DOI
DOI
10.1063/1.4974847
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DOAI
DOAI
10.1063/1.4974847
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Identifiant WoS
WOS:000395902700060
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Accès ouvert
OA - Non
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Source - Accès ouvert
OA - Non
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Type d'accès
Non OA
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Editeur
AIP Publishing
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Source
REVIEW OF SCIENTIFIC INSTRUMENTS
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ISSN
0034-6748
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Type de document
Article
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Notoriété
2 - Acceptable
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CNRS
Oui
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CNRS - Institut
INSIS - Institut des sciences de l'ingénierie et des systèmes
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uid:/FL734M96
12/10/2021 14:52:37 (latest)
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